Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors

10.1039/c4nr04184d

Saved in:
Bibliographic Details
Main Authors: Zhou H., Kropelnicki P., Lee C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: Royal Society of Chemistry 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/127851
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore