Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors
10.1039/c4nr04184d
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Royal Society of Chemistry
2016
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sg-nus-scholar.10635-1278512023-10-30T07:13:54Z Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors Zhou H. Kropelnicki P. Lee C. ELECTRICAL & COMPUTER ENGINEERING 10.1039/c4nr04184d Nanoscale 7 2 532-541 2016-09-20T01:42:17Z 2016-09-20T01:42:17Z 2015 Article Zhou H., Kropelnicki P., Lee C. (2015). Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors. Nanoscale 7 (2) : 532-541. ScholarBank@NUS Repository. https://doi.org/10.1039/c4nr04184d 20403364 http://scholarbank.nus.edu.sg/handle/10635/127851 000347245500021 Royal Society of Chemistry |
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Asia |
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Singapore Singapore |
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| description |
10.1039/c4nr04184d |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Zhou H. Kropelnicki P. Lee C. |
| format |
Article |
| author |
Zhou H. Kropelnicki P. Lee C. |
| spellingShingle |
Zhou H. Kropelnicki P. Lee C. Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| author_sort |
Zhou H. |
| title |
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| title_short |
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| title_full |
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| title_fullStr |
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| title_full_unstemmed |
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| title_sort |
characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors |
| publisher |
Royal Society of Chemistry |
| publishDate |
2016 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/127851 |
| _version_ |
1781790454276161536 |