Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors
10.1039/c4nr04184d
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
Royal Society of Chemistry
2016
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/127851 |
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| Institution: | National University of Singapore |