The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions

10.1063/1.4913451

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Bibliographic Details
Main Authors:	Hameiri Z., Ma, F.-J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	American Institute of Physics Inc. 2016
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/128145
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-128145
record_format	dspace
spelling	sg-nus-scholar.10635-1281452023-10-29T21:07:48Z The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions Hameiri Z. Ma, F.-J. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.4913451 Journal of Applied Physics 117 8 2016-09-20T05:46:18Z 2016-09-20T05:46:18Z 2015 Article Hameiri Z., Ma, F.-J. (2015). The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions. Journal of Applied Physics 117 (8). ScholarBank@NUS Repository. https://doi.org/10.1063/1.4913451 00218979 http://scholarbank.nus.edu.sg/handle/10635/128145 000351132500074 American Institute of Physics Inc.
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.4913451
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Hameiri Z. Ma, F.-J.
format	Article
author	Hameiri Z. Ma, F.-J.
spellingShingle	Hameiri Z. Ma, F.-J. The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
author_sort	Hameiri Z.
title	The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
title_short	The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
title_full	The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
title_fullStr	The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
title_full_unstemmed	The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
title_sort	impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions
publisher	American Institute of Physics Inc.
publishDate	2016
url	http://scholarbank.nus.edu.sg/handle/10635/128145
_version_	1781790526898438144

The impact of surface damage region and edge recombination on the effective lifetime of silicon wafers at low illumination conditions

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