Systematic investigation on the ultratrace analytical monitoring of anionic surfactants on silicon wafer surface by capillary electrophoresis using designed experiments

Systematic investigation on the ultratrace analytical monitoring of anionic surfactants on silicon wafer surface by capillary electrophoresis using designed experiments

Master's

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Bibliographic Details
Main Author: HOO SIEOW CHENG
Other Authors: CHEMISTRY
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Ultra-Trace, Surfactant, Silicon wafer, surface contaminants, Taguchi methodology, Optimization.
Online Access:http://scholarbank.nus.edu.sg/handle/10635/14819
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Institution: National University of Singapore
Language: English

Internet

http://scholarbank.nus.edu.sg/handle/10635/14819

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