Systematic investigation on the ultratrace analytical monitoring of anionic surfactants on silicon wafer surface by capillary electrophoresis using designed experiments

• Main Author: HOO SIEOW CHENG
• Other Authors: CHEMISTRY
• Format: Theses and Dissertations
• Language: English
• Published: 2010
• Subjects: Ultra-Trace, Surfactant, Silicon wafer, surface contaminants, Taguchi methodology, Optimization.
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/14819
• Institution: National University of Singapore

Master's