Impact ionization by hot carriers in a black phosphorus field effect transistor

10.1038/s41467-018-05981-0

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Main Authors: Ahmed F., Kim Y.D., Yang Z., He P., Hwang E., Yang H., Hone J., Yoo W.J.
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Nature Publishing Group 2019
Online Access:http://scholarbank.nus.edu.sg/handle/10635/152072
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spelling sg-nus-scholar.10635-1520722024-04-17T03:20:12Z Impact ionization by hot carriers in a black phosphorus field effect transistor Ahmed F. Kim Y.D. Yang Z. He P. Hwang E. Yang H. Hone J. Yoo W.J. ELECTRICAL AND COMPUTER ENGINEERING 10.1038/s41467-018-05981-0 Nature Communications 9 1 3414 2019-03-08T01:10:37Z 2019-03-08T01:10:37Z 2018-12-01 Article Ahmed F., Kim Y.D., Yang Z., He P., Hwang E., Yang H., Hone J., Yoo W.J. (2018-12-01). Impact ionization by hot carriers in a black phosphorus field effect transistor. Nature Communications 9 (1) : 3414. ScholarBank@NUS Repository. https://doi.org/10.1038/s41467-018-05981-0 2041-1723 http://scholarbank.nus.edu.sg/handle/10635/152072 Nature Publishing Group Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1038/s41467-018-05981-0
author2 ELECTRICAL AND COMPUTER ENGINEERING
author_facet ELECTRICAL AND COMPUTER ENGINEERING
Ahmed F.
Kim Y.D.
Yang Z.
He P.
Hwang E.
Yang H.
Hone J.
Yoo W.J.
format Article
author Ahmed F.
Kim Y.D.
Yang Z.
He P.
Hwang E.
Yang H.
Hone J.
Yoo W.J.
spellingShingle Ahmed F.
Kim Y.D.
Yang Z.
He P.
Hwang E.
Yang H.
Hone J.
Yoo W.J.
Impact ionization by hot carriers in a black phosphorus field effect transistor
author_sort Ahmed F.
title Impact ionization by hot carriers in a black phosphorus field effect transistor
title_short Impact ionization by hot carriers in a black phosphorus field effect transistor
title_full Impact ionization by hot carriers in a black phosphorus field effect transistor
title_fullStr Impact ionization by hot carriers in a black phosphorus field effect transistor
title_full_unstemmed Impact ionization by hot carriers in a black phosphorus field effect transistor
title_sort impact ionization by hot carriers in a black phosphorus field effect transistor
publisher Nature Publishing Group
publishDate 2019
url http://scholarbank.nus.edu.sg/handle/10635/152072
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