Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination
10.1109/JPHOTOV.2017.2706424
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2019
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sg-nus-scholar.10635-1550412023-09-08T09:17:13Z Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination Hameiri, Ziv Borojevic, Nino Mai, Ly Nandakumar, Naomi Kim, Kyung Winderbaum, Saul SOLAR ENERGY RESEARCH INST OF S'PORE Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Photovoltaic cells silicon silicon nitride surface passivation INTRINSIC CARRIER DENSITY CHEMICAL-VAPOR-DEPOSITION CRYSTALLINE SILICON SOLAR-CELLS PASSIVATION HYDROGEN SI J(0)-ANALYSIS PECVD 10.1109/JPHOTOV.2017.2706424 IEEE JOURNAL OF PHOTOVOLTAICS 7 4 996-1003 2019-06-03T04:32:17Z 2019-06-03T04:32:17Z 2017-07-01 2019-06-03T01:37:30Z Article Hameiri, Ziv, Borojevic, Nino, Mai, Ly, Nandakumar, Naomi, Kim, Kyung, Winderbaum, Saul (2017-07-01). Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination. IEEE JOURNAL OF PHOTOVOLTAICS 7 (4) : 996-1003. ScholarBank@NUS Repository. https://doi.org/10.1109/JPHOTOV.2017.2706424 2156-3381 2156-3403 https://scholarbank.nus.edu.sg/handle/10635/155041 en IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC Elements |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Photovoltaic cells silicon silicon nitride surface passivation INTRINSIC CARRIER DENSITY CHEMICAL-VAPOR-DEPOSITION CRYSTALLINE SILICON SOLAR-CELLS PASSIVATION HYDROGEN SI J(0)-ANALYSIS PECVD |
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Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Photovoltaic cells silicon silicon nitride surface passivation INTRINSIC CARRIER DENSITY CHEMICAL-VAPOR-DEPOSITION CRYSTALLINE SILICON SOLAR-CELLS PASSIVATION HYDROGEN SI J(0)-ANALYSIS PECVD Hameiri, Ziv Borojevic, Nino Mai, Ly Nandakumar, Naomi Kim, Kyung Winderbaum, Saul Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
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10.1109/JPHOTOV.2017.2706424 |
author2 |
SOLAR ENERGY RESEARCH INST OF S'PORE |
author_facet |
SOLAR ENERGY RESEARCH INST OF S'PORE Hameiri, Ziv Borojevic, Nino Mai, Ly Nandakumar, Naomi Kim, Kyung Winderbaum, Saul |
format |
Article |
author |
Hameiri, Ziv Borojevic, Nino Mai, Ly Nandakumar, Naomi Kim, Kyung Winderbaum, Saul |
author_sort |
Hameiri, Ziv |
title |
Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
title_short |
Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
title_full |
Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
title_fullStr |
Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
title_full_unstemmed |
Low-Absorbing and Thermally Stable Industrial Silicon Nitride Films With Very Low Surface Recombination |
title_sort |
low-absorbing and thermally stable industrial silicon nitride films with very low surface recombination |
publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
publishDate |
2019 |
url |
https://scholarbank.nus.edu.sg/handle/10635/155041 |
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1778169052595748864 |