High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions

10.1109/TNANO.2015.2456510

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Bibliographic Details
Main Authors:	Kwon, Kon-Woo, Fong, Xuanyao, Wijesinghe, Parami, Panda, Priyadarshini, Roy, Kaushik
Other Authors:	DEPT OF ELECTRICAL & COMPUTER ENGG
Format:	Article
Language:	English
Published:	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2019
Subjects:	Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Engineering Science & Technology - Other Topics Materials Science Physics Cache density error correcting code invert coding magnetic tunnel junction (MTJ) process variation spin transfer torque magnetic random access memory (STT-MRAM) thermal stability factor yield SPIN TRANSFER ANISOTROPY MAGNETORESISTANCE INPLANE CACHE POWER RAM
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/156178
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-156178
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spelling	sg-nus-scholar.10635-1561782023-10-31T08:58:11Z High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions Kwon, Kon-Woo Fong, Xuanyao Wijesinghe, Parami Panda, Priyadarshini Roy, Kaushik DEPT OF ELECTRICAL & COMPUTER ENGG Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Engineering Science & Technology - Other Topics Materials Science Physics Cache density error correcting code invert coding magnetic tunnel junction (MTJ) process variation spin transfer torque magnetic random access memory (STT-MRAM) thermal stability factor yield SPIN TRANSFER ANISOTROPY MAGNETORESISTANCE INPLANE CACHE POWER RAM 10.1109/TNANO.2015.2456510 IEEE TRANSACTIONS ON NANOTECHNOLOGY 14 6 1024-1034 2019-07-03T03:24:51Z 2019-07-03T03:24:51Z 2015-11-01 2019-07-03T03:05:05Z Article Kwon, Kon-Woo, Fong, Xuanyao, Wijesinghe, Parami, Panda, Priyadarshini, Roy, Kaushik (2015-11-01). High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions. IEEE TRANSACTIONS ON NANOTECHNOLOGY 14 (6) : 1024-1034. ScholarBank@NUS Repository. https://doi.org/10.1109/TNANO.2015.2456510 1536-125X 1941-0085 https://scholarbank.nus.edu.sg/handle/10635/156178 en IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC Elements
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Engineering Science & Technology - Other Topics Materials Science Physics Cache density error correcting code invert coding magnetic tunnel junction (MTJ) process variation spin transfer torque magnetic random access memory (STT-MRAM) thermal stability factor yield SPIN TRANSFER ANISOTROPY MAGNETORESISTANCE INPLANE CACHE POWER RAM
spellingShingle	Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Engineering Science & Technology - Other Topics Materials Science Physics Cache density error correcting code invert coding magnetic tunnel junction (MTJ) process variation spin transfer torque magnetic random access memory (STT-MRAM) thermal stability factor yield SPIN TRANSFER ANISOTROPY MAGNETORESISTANCE INPLANE CACHE POWER RAM Kwon, Kon-Woo Fong, Xuanyao Wijesinghe, Parami Panda, Priyadarshini Roy, Kaushik High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
description	10.1109/TNANO.2015.2456510
author2	DEPT OF ELECTRICAL & COMPUTER ENGG
author_facet	DEPT OF ELECTRICAL & COMPUTER ENGG Kwon, Kon-Woo Fong, Xuanyao Wijesinghe, Parami Panda, Priyadarshini Roy, Kaushik
format	Article
author	Kwon, Kon-Woo Fong, Xuanyao Wijesinghe, Parami Panda, Priyadarshini Roy, Kaushik
author_sort	Kwon, Kon-Woo
title	High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
title_short	High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
title_full	High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
title_fullStr	High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
title_full_unstemmed	High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions
title_sort	high-density and robust stt-mram array through device/circuit/architecture interactions
publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
publishDate	2019
url	https://scholarbank.nus.edu.sg/handle/10635/156178
_version_	1781791692038340608

High-Density and Robust STT-MRAM Array Through Device/Circuit/Architecture Interactions

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