Threshold voltage instabilities in MOS transistors with advanced gate dielectrics

Threshold voltage instabilities in MOS transistors with advanced gate dielectrics

Ph.D

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Bibliographic Details
Main Author: SHEN CHEN
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
MOS, transistor, reliability, characterization, charge trapping, NBTI
Online Access:http://scholarbank.nus.edu.sg/handle/10635/15856
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Institution: National University of Singapore
Language: English
id sg-nus-scholar.10635-15856
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spelling sg-nus-scholar.10635-158562015-01-07T00:27:17Z Threshold voltage instabilities in MOS transistors with advanced gate dielectrics SHEN CHEN ELECTRICAL & COMPUTER ENGINEERING LI MING-FU YEO YEE CHIA MOS, transistor, reliability, characterization, charge trapping, NBTI Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:58:08Z 2010-04-08T10:58:08Z 2009-04-27 Thesis SHEN CHEN (2009-04-27). Threshold voltage instabilities in MOS transistors with advanced gate dielectrics. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/15856 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic MOS, transistor, reliability, characterization, charge trapping, NBTI
spellingShingle MOS, transistor, reliability, characterization, charge trapping, NBTI
SHEN CHEN
Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
description Ph.D
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
SHEN CHEN
format Theses and Dissertations
author SHEN CHEN
author_sort SHEN CHEN
title Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
title_short Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
title_full Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
title_fullStr Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
title_full_unstemmed Threshold voltage instabilities in MOS transistors with advanced gate dielectrics
title_sort threshold voltage instabilities in mos transistors with advanced gate dielectrics
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/15856
_version_ 1681079264984694784

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