Ordered fragmentation of oxide thin films at submicron scale

10.1038/ncomms13148

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Bibliographic Details
Main Authors: Guo, L, Ren, Y, Kong, L.Y, Chim, W.K, Chiam, S.Y
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Article
Published: Nature Publishing Group 2020
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/174926
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Institution: National University of Singapore