Ordered fragmentation of oxide thin films at submicron scale

10.1038/ncomms13148

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Bibliographic Details
Main Authors:	Guo, L, Ren, Y, Kong, L.Y, Chim, W.K, Chiam, S.Y
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Published:	Nature Publishing Group 2020
Subjects:	metal oxide nanocrystal nanomaterial composite crack propagation film fragmentation nanoparticle oxide strength anisotropy Article chemical structure electroplating industry film coating heat treatment particle size scanning electron microscopy surface property thickness water loss X ray diffraction X ray photoelectron spectroscopy
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/174926
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-174926
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spelling	sg-nus-scholar.10635-1749262024-11-14T10:20:49Z Ordered fragmentation of oxide thin films at submicron scale Guo, L Ren, Y Kong, L.Y Chim, W.K Chiam, S.Y ELECTRICAL AND COMPUTER ENGINEERING metal oxide nanocrystal nanomaterial composite crack propagation film fragmentation nanoparticle oxide strength anisotropy Article chemical structure electroplating industry film film coating heat treatment particle size scanning electron microscopy surface property thickness water loss X ray diffraction X ray photoelectron spectroscopy 10.1038/ncomms13148 Nature Communications 7 13148 2020-09-09T01:25:52Z 2020-09-09T01:25:52Z 2016 Article Guo, L, Ren, Y, Kong, L.Y, Chim, W.K, Chiam, S.Y (2016). Ordered fragmentation of oxide thin films at submicron scale. Nature Communications 7 : 13148. ScholarBank@NUS Repository. https://doi.org/10.1038/ncomms13148 20411723 https://scholarbank.nus.edu.sg/handle/10635/174926 Nature Publishing Group Unpaywall 20200831
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	metal oxide nanocrystal nanomaterial composite crack propagation film fragmentation nanoparticle oxide strength anisotropy Article chemical structure electroplating industry film film coating heat treatment particle size scanning electron microscopy surface property thickness water loss X ray diffraction X ray photoelectron spectroscopy
spellingShingle	metal oxide nanocrystal nanomaterial composite crack propagation film fragmentation nanoparticle oxide strength anisotropy Article chemical structure electroplating industry film film coating heat treatment particle size scanning electron microscopy surface property thickness water loss X ray diffraction X ray photoelectron spectroscopy Guo, L Ren, Y Kong, L.Y Chim, W.K Chiam, S.Y Ordered fragmentation of oxide thin films at submicron scale
description	10.1038/ncomms13148
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING Guo, L Ren, Y Kong, L.Y Chim, W.K Chiam, S.Y
format	Article
author	Guo, L Ren, Y Kong, L.Y Chim, W.K Chiam, S.Y
author_sort	Guo, L
title	Ordered fragmentation of oxide thin films at submicron scale
title_short	Ordered fragmentation of oxide thin films at submicron scale
title_full	Ordered fragmentation of oxide thin films at submicron scale
title_fullStr	Ordered fragmentation of oxide thin films at submicron scale
title_full_unstemmed	Ordered fragmentation of oxide thin films at submicron scale
title_sort	ordered fragmentation of oxide thin films at submicron scale
publisher	Nature Publishing Group
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/174926
_version_	1821229719761190912

Ordered fragmentation of oxide thin films at submicron scale

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