Ordered fragmentation of oxide thin films at submicron scale
10.1038/ncomms13148
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Main Authors: | Guo, L, Ren, Y, Kong, L.Y, Chim, W.K, Chiam, S.Y |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Article |
Published: |
Nature Publishing Group
2020
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/174926 |
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Institution: | National University of Singapore |
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