Ordered fragmentation of oxide thin films at submicron scale

Ordered fragmentation of oxide thin films at submicron scale

10.1038/ncomms13148

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Bibliographic Details
Main Authors:	Guo, L, Ren, Y, Kong, L.Y, Chim, W.K, Chiam, S.Y
Other Authors:	DEPT OF ELECTRICAL & COMPUTER ENGG
Format:	Article
Published:	Nature Publishing Group 2020
Subjects:	metal oxide nanocrystal nanomaterial composite crack propagation film fragmentation nanoparticle oxide strength anisotropy Article chemical structure electroplating industry film coating heat treatment particle size scanning electron microscopy surface property thickness water loss X ray diffraction X ray photoelectron spectroscopy
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/174926
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Institution:	National University of Singapore

Description
Summary:	10.1038/ncomms13148