CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES
Master's
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2020
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sg-nus-scholar.10635-1758392024-10-27T01:35:16Z CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES PALANIAPPAN MUTHUPALANIAPPAN B.E. ELECTRICAL ENGINEERING JACOB C. H. PHANG VIVIAN NG RALF HEIDERHOFF Photon emission microscopy Scanning thermal microscopy temperature distribution light emission backside imaging nMOSFET Master's MASTER OF ENGINEERING 2020-09-11T04:37:54Z 2020-09-11T04:37:54Z 1999 Thesis PALANIAPPAN MUTHUPALANIAPPAN B.E. (1999). CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/175839 CCK BATCHLOAD 20200918 |
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Singapore Singapore |
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Photon emission microscopy Scanning thermal microscopy temperature distribution light emission backside imaging nMOSFET |
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Photon emission microscopy Scanning thermal microscopy temperature distribution light emission backside imaging nMOSFET PALANIAPPAN MUTHUPALANIAPPAN B.E. CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
description |
Master's |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING PALANIAPPAN MUTHUPALANIAPPAN B.E. |
format |
Theses and Dissertations |
author |
PALANIAPPAN MUTHUPALANIAPPAN B.E. |
author_sort |
PALANIAPPAN MUTHUPALANIAPPAN B.E. |
title |
CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
title_short |
CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
title_full |
CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
title_fullStr |
CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
title_full_unstemmed |
CORRELATION OF ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTOR DEVICES |
title_sort |
correlation of electronic and thermal properties of semiconductor devices |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/175839 |
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1821218121056256000 |