Percolation theory based statistical resistance model for resistive random access memory

Percolation theory based statistical resistance model for resistive random access memory

10.1063/1.5023196

Saved in:
Bibliographic Details
Main Authors: WANG LINGFEI, THEAN VOON YEW, AARON
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: AIP 2020
Subjects:
Percolation theory based statistical resistance model for resistive random access memory
Online Access:https://scholarbank.nus.edu.sg/handle/10635/176214
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first

Similar Items