Percolation theory based statistical resistance model for resistive random access memory
10.1063/1.5023196
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Main Authors: | WANG LINGFEI, THEAN VOON YEW, AARON |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Article |
Published: |
AIP
2020
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Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/176214 |
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Institution: | National University of Singapore |
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