On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications
IEEE JOURNAL OF SOLID-STATE CIRCUITS
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2021
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sg-nus-scholar.10635-1922932024-11-13T04:44:01Z On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications Konandur Rajanna, Viveka Alioto, Massimo Bruno ELECTRICAL AND COMPUTER ENGINEERING Prof Massimo Bruno Alioto IEEE JOURNAL OF SOLID-STATE CIRCUITS United States 2021-06-29T08:50:35Z 2021-06-29T08:50:35Z 2021-06-26 2021-06-29T01:55:41Z Article Konandur Rajanna, Viveka, Alioto, Massimo Bruno (2021-06-26). On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications. IEEE JOURNAL OF SOLID-STATE CIRCUITS. ScholarBank@NUS Repository. 00189200 https://scholarbank.nus.edu.sg/handle/10635/192293 IEEE Elements |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
IEEE JOURNAL OF SOLID-STATE CIRCUITS |
| author2 |
ELECTRICAL AND COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL AND COMPUTER ENGINEERING Konandur Rajanna, Viveka Alioto, Massimo Bruno |
| format |
Article |
| author |
Konandur Rajanna, Viveka Alioto, Massimo Bruno |
| spellingShingle |
Konandur Rajanna, Viveka Alioto, Massimo Bruno On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| author_sort |
Konandur Rajanna, Viveka |
| title |
On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| title_short |
On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| title_full |
On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| title_fullStr |
On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| title_full_unstemmed |
On-Chip Links with Energy-Quality Tradeoff in Error-Resilient and Machine Learning Applications |
| title_sort |
on-chip links with energy-quality tradeoff in error-resilient and machine learning applications |
| publisher |
IEEE |
| publishDate |
2021 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/192293 |
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1821222783368036352 |