Bottom-electrode induced defects in self-assembled monolayer (SAM)-based tunnel junctions affect only the SAM resistance, not the contact resistance or SAM capacitance

Bottom-electrode induced defects in self-assembled monolayer (SAM)-based tunnel junctions affect only the SAM resistance, not the contact resistance or SAM capacitance

10.1039/c8ra01513a

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Bibliographic Details
Main Authors: Sangeeth, C.S.S., Jiang, L., Nijhuis, C.A.
Other Authors: CHEMISTRY
Format: Article
Published: Royal Society of Chemistry 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/210889
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Institution: National University of Singapore
Description
Summary:10.1039/c8ra01513a

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