Bottom-electrode induced defects in self-assembled monolayer (SAM)-based tunnel junctions affect only the SAM resistance, not the contact resistance or SAM capacitance
10.1039/c8ra01513a
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
Royal Society of Chemistry
2021
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/210889 |
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| Institution: | National University of Singapore |
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