X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
International Journal of Modern Physics B
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2011
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sg-nus-scholar.10635-212992024-11-15T04:35:55Z X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. REAL ESTATE SOCIOLOGY ELECTRICAL & COMPUTER ENGINEERING PHYSICS International Journal of Modern Physics B 16 28-29 4263-4266 IJPBE 2011-04-12T06:21:50Z 2011-04-12T06:21:50Z 2002 Conference Paper Leoy, C.C.,Choi, W.K.,Wong, K.L.,Wong, K.M.,Osipowicz, T.,Rong, J. (2002). X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films. International Journal of Modern Physics B 16 (28-29) : 4263-4266. ScholarBank@NUS Repository. 02179792 http://scholarbank.nus.edu.sg/handle/10635/21299 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
International Journal of Modern Physics B |
| author2 |
REAL ESTATE |
| author_facet |
REAL ESTATE Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. |
| format |
Conference or Workshop Item |
| author |
Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. |
| spellingShingle |
Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| author_sort |
Leoy, C.C. |
| title |
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| title_short |
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| title_full |
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| title_fullStr |
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| title_full_unstemmed |
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films |
| title_sort |
x-ray diffraction and raman studies of rf sputtered polycrystalline silicon germanium films |
| publishDate |
2011 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/21299 |
| _version_ |
1821207135184224256 |