X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films

International Journal of Modern Physics B

Saved in:
Bibliographic Details
Main Authors: Leoy, C.C., Choi, W.K., Wong, K.L., Wong, K.M., Osipowicz, T., Rong, J.
Other Authors: SOCIOLOGY
Format: Conference or Workshop Item
Published: 2011
Online Access:http://scholarbank.nus.edu.sg/handle/10635/21299
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-21299
record_format dspace
spelling sg-nus-scholar.10635-212992015-01-11T10:18:52Z X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films Leoy, C.C. Choi, W.K. Wong, K.L. Wong, K.M. Osipowicz, T. Rong, J. SOCIOLOGY PHYSICS ELECTRICAL & COMPUTER ENGINEERING REAL ESTATE International Journal of Modern Physics B 16 28-29 4263-4266 IJPBE 2011-04-12T06:21:50Z 2011-04-12T06:21:50Z 2002 Conference Paper Leoy, C.C.,Choi, W.K.,Wong, K.L.,Wong, K.M.,Osipowicz, T.,Rong, J. (2002). X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films. International Journal of Modern Physics B 16 (28-29) : 4263-4266. ScholarBank@NUS Repository. 02179792 http://scholarbank.nus.edu.sg/handle/10635/21299 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description International Journal of Modern Physics B
author2 SOCIOLOGY
author_facet SOCIOLOGY
Leoy, C.C.
Choi, W.K.
Wong, K.L.
Wong, K.M.
Osipowicz, T.
Rong, J.
format Conference or Workshop Item
author Leoy, C.C.
Choi, W.K.
Wong, K.L.
Wong, K.M.
Osipowicz, T.
Rong, J.
spellingShingle Leoy, C.C.
Choi, W.K.
Wong, K.L.
Wong, K.M.
Osipowicz, T.
Rong, J.
X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
author_sort Leoy, C.C.
title X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
title_short X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
title_full X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
title_fullStr X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
title_full_unstemmed X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films
title_sort x-ray diffraction and raman studies of rf sputtered polycrystalline silicon germanium films
publishDate 2011
url http://scholarbank.nus.edu.sg/handle/10635/21299
_version_ 1681079820690128896