$X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films$

X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films

International Journal of Modern Physics B

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Bibliographic Details
Main Authors:	Leoy, C.C., Choi, W.K., Wong, K.L., Wong, K.M., Osipowicz, T., Rong, J.
Other Authors:	SOCIOLOGY
Format:	Conference or Workshop Item
Published:	2011
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/21299
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Institution:	National University of Singapore

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