Effects of oxygen and moisture on the I-V characteristics of TiO2 thin films

Effects of oxygen and moisture on the I-V characteristics of TiO2 thin films

10.1016/j.jmat.2018.01.005

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Bibliographic Details
Main Authors: Lu, W., Wong, L.-M., Wang, S., Zeng, K.
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Chinese Ceramic Society 2022
Subjects:
c-AFM
Environmental control
FORC-IV
KPFM
Resistive switching
Online Access:https://scholarbank.nus.edu.sg/handle/10635/214031
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Institution: National University of Singapore
Description
Summary:10.1016/j.jmat.2018.01.005

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