Effects of oxygen and moisture on the I-V characteristics of TiO2 thin films

• Main Authors: Lu, W., Wong, L.-M., Wang, S., Zeng, K.
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Article
• Published: Chinese Ceramic Society 2022
• Subjects: c-AFM; Environmental control; FORC-IV; KPFM; Resistive switching
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/214031
• Institution: National University of Singapore

10.1016/j.jmat.2018.01.005