TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS
Master's
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2022
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sg-nus-scholar.10635-2299962022-08-05T18:00:20Z TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS DIONALDO ZUDHISTIRA MATERIALS SCIENCE AND ENGINEERING Michel Bosman lamella conversion, site-specific pillar sample, tomography Master's MASTER OF ENGINEERING (CDE) 2022-08-05T18:00:19Z 2022-08-05T18:00:19Z 2022-04-25 Thesis DIONALDO ZUDHISTIRA (2022-04-25). TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/229996 0000-0002-2305-5085 en |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
language |
English |
topic |
lamella conversion, site-specific pillar sample, tomography |
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lamella conversion, site-specific pillar sample, tomography DIONALDO ZUDHISTIRA TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
description |
Master's |
author2 |
MATERIALS SCIENCE AND ENGINEERING |
author_facet |
MATERIALS SCIENCE AND ENGINEERING DIONALDO ZUDHISTIRA |
format |
Theses and Dissertations |
author |
DIONALDO ZUDHISTIRA |
author_sort |
DIONALDO ZUDHISTIRA |
title |
TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
title_short |
TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
title_full |
TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
title_fullStr |
TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
title_full_unstemmed |
TEM SAMPLE PREPARATION TECHNIQUES DEVELOPMENT FOR ADVANCED IC INCLUDING FINFETS |
title_sort |
tem sample preparation techniques development for advanced ic including finfets |
publishDate |
2022 |
url |
https://scholarbank.nus.edu.sg/handle/10635/229996 |
_version_ |
1743119409248993280 |