Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems

10.3390/s21248271

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Bibliographic Details
Main Authors:	Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon
Other Authors:	DEPARTMENT OF COMPUTER SCIENCE
Format:	Article
Published:	MDPI 2022
Subjects:	Availability DDR5 Debugging DRAM chips Error correction codes Failure analysis Fault diagnosis Memory architecture Memory management On-die ECC Semiconductor device reliability Semiconductor device testing
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/231895
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-231895
record_format	dspace
spelling	sg-nus-scholar.10635-2318952023-10-31T08:54:51Z Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems Nguyen, Duy-Thanh Ho, Nhut-Minh Wong, Weng-Fai Chang, Ik-Joon DEPARTMENT OF COMPUTER SCIENCE Availability DDR5 Debugging DRAM chips Error correction codes Failure analysis Fault diagnosis Memory architecture Memory management On-die ECC Semiconductor device reliability Semiconductor device testing 10.3390/s21248271 Sensors 21 24 8271 2022-10-11T07:44:44Z 2022-10-11T07:44:44Z 2021-12-10 Article Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon (2021-12-10). Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems. Sensors 21 (24) : 8271. ScholarBank@NUS Repository. https://doi.org/10.3390/s21248271 1424-8220 https://scholarbank.nus.edu.sg/handle/10635/231895 Attribution 4.0 International https://creativecommons.org/licenses/by/4.0/ MDPI Scopus OA2021
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Availability DDR5 Debugging DRAM chips Error correction codes Failure analysis Fault diagnosis Memory architecture Memory management On-die ECC Semiconductor device reliability Semiconductor device testing
spellingShingle	Availability DDR5 Debugging DRAM chips Error correction codes Failure analysis Fault diagnosis Memory architecture Memory management On-die ECC Semiconductor device reliability Semiconductor device testing Nguyen, Duy-Thanh Ho, Nhut-Minh Wong, Weng-Fai Chang, Ik-Joon Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
description	10.3390/s21248271
author2	DEPARTMENT OF COMPUTER SCIENCE
author_facet	DEPARTMENT OF COMPUTER SCIENCE Nguyen, Duy-Thanh Ho, Nhut-Minh Wong, Weng-Fai Chang, Ik-Joon
format	Article
author	Nguyen, Duy-Thanh Ho, Nhut-Minh Wong, Weng-Fai Chang, Ik-Joon
author_sort	Nguyen, Duy-Thanh
title	Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
title_short	Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
title_full	Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
title_fullStr	Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
title_full_unstemmed	Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
title_sort	obet: on-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
publisher	MDPI
publishDate	2022
url	https://scholarbank.nus.edu.sg/handle/10635/231895
_version_	1781793236384219136

Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems

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