Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems

Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems

10.3390/s21248271

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Bibliographic Details
Main Authors: Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon
Other Authors: DEPARTMENT OF COMPUTER SCIENCE
Format: Article
Published: MDPI 2022
Subjects:
Availability
DDR5
Debugging
DRAM chips
Error correction codes
Failure analysis
Fault diagnosis
Memory architecture
Memory management
On-die ECC
Semiconductor device reliability
Semiconductor device testing
Online Access:https://scholarbank.nus.edu.sg/handle/10635/231895
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Institution: National University of Singapore
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