Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
10.3390/s21248271
Saved in:
Main Authors: | Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon |
---|---|
Other Authors: | DEPARTMENT OF COMPUTER SCIENCE |
Format: | Article |
Published: |
MDPI
2022
|
Subjects: | |
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/231895 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Analysis of premature breakdown in high-power devices using IBIC microscopy
by: Zmeck, M., et al.
Published: (2014) -
A fast measurement technique of MOSFET Id-Vg characteristics
by: Shen, C., et al.
Published: (2014) -
Design criteria assessment for ball grid array semiconductor packaging based on thermomechanical simulation and crack analysis
by: Lim, Niño Rigo Emil G.
Published: (2018) -
DRAM failure prediction in AIOps: Empirical evaluation, challenges and opportunities
by: WU, Zhiyue, et al.
Published: (2021) -
Interaction of interface-traps located at various sites in MOSFETs under stress
by: Chen, G., et al.
Published: (2014)