Impact of Trap Profile on the Characteristics of 2-D MoS<sub>2</sub> Memtransistors: A Simulation Study

10.1109/TED.2022.3186867

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Bibliographic Details
Main Authors: Zhang, Panpan, Feng, Xuewei, Fong, Xuanyao
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2023
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Online Access:https://scholarbank.nus.edu.sg/handle/10635/245754
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Institution: National University of Singapore
Language: English
Description
Summary:10.1109/TED.2022.3186867