Impact of Trap Profile on the Characteristics of 2-D MoS<sub>2</sub> Memtransistors: A Simulation Study
10.1109/TED.2022.3186867
Saved in:
| Main Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2023
|
| Subjects: | |
| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/245754 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| Language: | English |