Aggressive Leakage Current Reduction for Embedded MRAM Using Block-Level Power Gating

Aggressive Leakage Current Reduction for Embedded MRAM Using Block-Level Power Gating

10.1109/iecon43393.2020.9254774

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Bibliographic Details
Main Authors: Anh, Tuan Do, Fong, Xuanyao, Li, Fei
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: IEEE 2023
Subjects:
Science & Technology
Technology
Automation & Control Systems
Computer Science, Information Systems
Computer Science, Theory & Methods
Green & Sustainable Science & Technology
Energy & Fuels
Engineering, Manufacturing
Engineering, Electrical & Electronic
Robotics
Computer Science
Science & Technology - Other Topics
Engineering
MRAM
low-power
low-leakage
normally-off system
SCHEME
Online Access:https://scholarbank.nus.edu.sg/handle/10635/245796
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Institution: National University of Singapore

Internet

https://scholarbank.nus.edu.sg/handle/10635/245796

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