Aggressive Leakage Current Reduction for Embedded MRAM Using Block-Level Power Gating

Aggressive Leakage Current Reduction for Embedded MRAM Using Block-Level Power Gating

10.1109/iecon43393.2020.9254774

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Bibliographic Details
Main Authors:	Anh, Tuan Do, Fong, Xuanyao, Li, Fei
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	IEEE 2023
Subjects:	Science & Technology Technology Automation & Control Systems Computer Science, Information Systems Computer Science, Theory & Methods Green & Sustainable Science & Technology Energy & Fuels Engineering, Manufacturing Engineering, Electrical & Electronic Robotics Computer Science Science & Technology - Other Topics Engineering MRAM low-power low-leakage normally-off system SCHEME
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/245796
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Institution:	National University of Singapore

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