Aggressive Leakage Current Reduction for Embedded MRAM Using Block-Level Power Gating
10.1109/iecon43393.2020.9254774
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Conference or Workshop Item |
| Published: |
IEEE
2023
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| Subjects: | |
| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/245796 |
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| Institution: | National University of Singapore |