In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique

In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique

10.1109/PVSC.2011.6186582

Saved in:
Bibliographic Details
Main Authors: Law, F., Hoex, B., Wang, J., Luther, J., Sharma, K., Creatore, M., Van De Sanden, M.C.M.
Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/52639
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-52639
record_format dspace
spelling sg-nus-scholar.10635-526392015-02-05T02:57:29Z In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique Law, F. Hoex, B. Wang, J. Luther, J. Sharma, K. Creatore, M. Van De Sanden, M.C.M. SOLAR ENERGY RESEARCH INST OF S'PORE NUS NANOSCIENCE & NANOTECH INITIATIVE MATERIALS SCIENCE AND ENGINEERING 10.1109/PVSC.2011.6186582 Conference Record of the IEEE Photovoltaic Specialists Conference 003026-003030 CRCND 2014-05-16T07:03:08Z 2014-05-16T07:03:08Z 2011 Conference Paper Law, F.,Hoex, B.,Wang, J.,Luther, J.,Sharma, K.,Creatore, M.,Van De Sanden, M.C.M. (2011). In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique. Conference Record of the IEEE Photovoltaic Specialists Conference : 003026-003030. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/PVSC.2011.6186582" target="_blank">https://doi.org/10.1109/PVSC.2011.6186582</a> 9781424499656 01608371 http://scholarbank.nus.edu.sg/handle/10635/52639 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/PVSC.2011.6186582
author2 SOLAR ENERGY RESEARCH INST OF S'PORE
author_facet SOLAR ENERGY RESEARCH INST OF S'PORE
Law, F.
Hoex, B.
Wang, J.
Luther, J.
Sharma, K.
Creatore, M.
Van De Sanden, M.C.M.
format Conference or Workshop Item
author Law, F.
Hoex, B.
Wang, J.
Luther, J.
Sharma, K.
Creatore, M.
Van De Sanden, M.C.M.
spellingShingle Law, F.
Hoex, B.
Wang, J.
Luther, J.
Sharma, K.
Creatore, M.
Van De Sanden, M.C.M.
In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
author_sort Law, F.
title In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
title_short In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
title_full In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
title_fullStr In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
title_full_unstemmed In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
title_sort in-situ x-ray diffraction analysis of the crystallisation of a-si:h films deposited by the expanding thermal plasma technique
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/52639
_version_ 1681084018851840000

Similar Items