In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma technique
10.1109/PVSC.2011.6186582
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Main Authors: | Law, F., Hoex, B., Wang, J., Luther, J., Sharma, K., Creatore, M., Van De Sanden, M.C.M. |
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Other Authors: | SOLAR ENERGY RESEARCH INST OF S'PORE |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/52639 |
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Institution: | National University of Singapore |
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