Demagnification-by-bias in proximity X-ray lithography

Proceedings of SPIE - The International Society for Optical Engineering

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書目詳細資料
Main Authors: Ren, Kong Jong, Leonard, Quinn, Vladimirsky, Yuli, Bourdillon, Antony
其他作者: MATERIALS SCIENCE
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/53284
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