A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs
10.1109/16.662798
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sg-nus-scholar.10635-539912023-10-31T07:11:19Z A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME 10.1109/16.662798 IEEE Transactions on Electron Devices 45 4 895-903 IETDA 2014-06-16T09:24:59Z 2014-06-16T09:24:59Z 1998 Article Ang, D.S., Ling, C.H. (1998). A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs. IEEE Transactions on Electron Devices 45 (4) : 895-903. ScholarBank@NUS Repository. https://doi.org/10.1109/16.662798 00189383 http://scholarbank.nus.edu.sg/handle/10635/53991 000072662800021 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| description |
10.1109/16.662798 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
| format |
Article |
| author |
Ang, D.S. Ling, C.H. |
| spellingShingle |
Ang, D.S. Ling, C.H. A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| author_sort |
Ang, D.S. |
| title |
A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| title_short |
A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| title_full |
A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| title_fullStr |
A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| title_full_unstemmed |
A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs |
| title_sort |
comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-mosfets |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/53991 |
| _version_ |
1781411920303095808 |