A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing

A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing

10.1109/55.962661

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Bibliographic Details
Main Author: Ang, D.S.
Other Authors: BACHELOR OF TECHNOLOGY PROGRAMME
Format: Article
Published: 2014
Subjects:
AC stress
Dynamic stress
Hot carriers
LDD MOSFET
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54518
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-545182023-10-27T07:21:40Z A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing Ang, D.S. BACHELOR OF TECHNOLOGY PROGRAMME AC stress Dynamic stress Hot carriers LDD MOSFET 10.1109/55.962661 IEEE Electron Device Letters 22 11 553-555 EDLED 2014-06-16T09:32:00Z 2014-06-16T09:32:00Z 2001-11 Article Ang, D.S. (2001-11). A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing. IEEE Electron Device Letters 22 (11) : 553-555. ScholarBank@NUS Repository. https://doi.org/10.1109/55.962661 07413106 http://scholarbank.nus.edu.sg/handle/10635/54518 000171933100019 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic AC stress
Dynamic stress
Hot carriers
LDD MOSFET
spellingShingle AC stress
Dynamic stress
Hot carriers
LDD MOSFET
Ang, D.S.
A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
description 10.1109/55.962661
author2 BACHELOR OF TECHNOLOGY PROGRAMME
author_facet BACHELOR OF TECHNOLOGY PROGRAMME
Ang, D.S.
format Article
author Ang, D.S.
author_sort Ang, D.S.
title A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
title_short A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
title_full A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
title_fullStr A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
title_full_unstemmed A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing
title_sort new insight into the degradation behavior of the ldd n-mosfet during dynamic hot-carrier stressing
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/54518
_version_ 1781411991735238656

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