Automatic integrated circuit die positioning in the scanning electron microscope
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sg-nus-scholar.10635-551692015-02-27T15:57:18Z Automatic integrated circuit die positioning in the scanning electron microscope Tan, H.W. Phang, J.C.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING Automation Die positioning Registration Scanning electron microscopy Template matching Scanning 24 2 86-91 SCNND 2014-06-17T02:39:58Z 2014-06-17T02:39:58Z 2002 Article Tan, H.W.,Phang, J.C.H.,Thong, J.T.L. (2002). Automatic integrated circuit die positioning in the scanning electron microscope. Scanning 24 (2) : 86-91. ScholarBank@NUS Repository. 01610457 http://scholarbank.nus.edu.sg/handle/10635/55169 NOT_IN_WOS Scopus |
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Automation Die positioning Registration Scanning electron microscopy Template matching |
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Automation Die positioning Registration Scanning electron microscopy Template matching Tan, H.W. Phang, J.C.H. Thong, J.T.L. Automatic integrated circuit die positioning in the scanning electron microscope |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Tan, H.W. Phang, J.C.H. Thong, J.T.L. |
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Tan, H.W. Phang, J.C.H. Thong, J.T.L. |
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Tan, H.W. |
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Automatic integrated circuit die positioning in the scanning electron microscope |
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Automatic integrated circuit die positioning in the scanning electron microscope |
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Automatic integrated circuit die positioning in the scanning electron microscope |
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Automatic integrated circuit die positioning in the scanning electron microscope |
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Automatic integrated circuit die positioning in the scanning electron microscope |
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automatic integrated circuit die positioning in the scanning electron microscope |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55169 |
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