Automatic integrated circuit die positioning in the scanning electron microscope

Scanning

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Bibliographic Details
Main Authors: Tan, H.W., Phang, J.C.H., Thong, J.T.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55169
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-551692015-02-27T15:57:18Z Automatic integrated circuit die positioning in the scanning electron microscope Tan, H.W. Phang, J.C.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING Automation Die positioning Registration Scanning electron microscopy Template matching Scanning 24 2 86-91 SCNND 2014-06-17T02:39:58Z 2014-06-17T02:39:58Z 2002 Article Tan, H.W.,Phang, J.C.H.,Thong, J.T.L. (2002). Automatic integrated circuit die positioning in the scanning electron microscope. Scanning 24 (2) : 86-91. ScholarBank@NUS Repository. 01610457 http://scholarbank.nus.edu.sg/handle/10635/55169 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Automation
Die positioning
Registration
Scanning electron microscopy
Template matching
spellingShingle Automation
Die positioning
Registration
Scanning electron microscopy
Template matching
Tan, H.W.
Phang, J.C.H.
Thong, J.T.L.
Automatic integrated circuit die positioning in the scanning electron microscope
description Scanning
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tan, H.W.
Phang, J.C.H.
Thong, J.T.L.
format Article
author Tan, H.W.
Phang, J.C.H.
Thong, J.T.L.
author_sort Tan, H.W.
title Automatic integrated circuit die positioning in the scanning electron microscope
title_short Automatic integrated circuit die positioning in the scanning electron microscope
title_full Automatic integrated circuit die positioning in the scanning electron microscope
title_fullStr Automatic integrated circuit die positioning in the scanning electron microscope
title_full_unstemmed Automatic integrated circuit die positioning in the scanning electron microscope
title_sort automatic integrated circuit die positioning in the scanning electron microscope
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/55169
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