Diagram representations of charge pumping processes in CMOS transistors

• Main Authors: Xinyun, H., Guangfan, J., Chen, S., Wei, C., Daming, H., Mingfu, L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Bias temperature instability; Charge pumping; Interface-trap generation; Modified CP; Oxide charge
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55629
• Institution: National University of Singapore

10.1088/1674-4926/31/8/084003