Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery

Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery

10.1088/1674-4926/30/7/074008

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Bibliographic Details
Main Authors: Luo, Y., Huang, D., Liu, W., Li, M.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Charge pumping
Direct-current current-voltage
Interface-trap generation/passivation
Negative bias temperature instability
Reaction-diffusion model
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82020
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/82020

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