Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery

10.1088/1674-4926/30/7/074008

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Main Authors:	Luo, Y., Huang, D., Liu, W., Li, M.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Charge pumping Direct-current current-voltage Interface-trap generation/passivation Negative bias temperature instability Reaction-diffusion model
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82020
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82020
record_format	dspace
spelling	sg-nus-scholar.10635-820202023-10-26T09:02:17Z Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery Luo, Y. Huang, D. Liu, W. Li, M. ELECTRICAL & COMPUTER ENGINEERING Charge pumping Direct-current current-voltage Interface-trap generation/passivation Negative bias temperature instability Reaction-diffusion model 10.1088/1674-4926/30/7/074008 Journal of Semiconductors 30 7 - 2014-10-07T04:24:27Z 2014-10-07T04:24:27Z 2009 Article Luo, Y., Huang, D., Liu, W., Li, M. (2009). Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery. Journal of Semiconductors 30 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/1674-4926/30/7/074008 16744926 http://scholarbank.nus.edu.sg/handle/10635/82020 000214934900016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Charge pumping Direct-current current-voltage Interface-trap generation/passivation Negative bias temperature instability Reaction-diffusion model
spellingShingle	Charge pumping Direct-current current-voltage Interface-trap generation/passivation Negative bias temperature instability Reaction-diffusion model Luo, Y. Huang, D. Liu, W. Li, M. Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
description	10.1088/1674-4926/30/7/074008
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Luo, Y. Huang, D. Liu, W. Li, M.
format	Article
author	Luo, Y. Huang, D. Liu, W. Li, M.
author_sort	Luo, Y.
title	Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
title_short	Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
title_full	Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
title_fullStr	Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
title_full_unstemmed	Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
title_sort	boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82020
_version_	1781784041880551424

Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery

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