Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery
10.1088/1674-4926/30/7/074008
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Main Authors: | Luo, Y., Huang, D., Liu, W., Li, M. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82020 |
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Institution: | National University of Singapore |
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