Diagram representations of charge pumping processes in CMOS transistors

Diagram representations of charge pumping processes in CMOS transistors

10.1088/1674-4926/31/8/084003

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Bibliographic Details
Main Authors: Xinyun, H., Guangfan, J., Chen, S., Wei, C., Daming, H., Mingfu, L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Bias temperature instability
Charge pumping
Interface-trap generation
Modified CP
Oxide charge
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55629
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Institution: National University of Singapore

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