Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix

10.1063/1.1608480

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Bibliographic Details
Main Authors:	Kan, E.W.H., Choi, W.K., Leoy, C.C., Chim, W.K., Antoniadis, D.A., Fitzgerald, E.A.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55741
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-55741
record_format	dspace
spelling	sg-nus-scholar.10635-557412023-10-31T20:06:24Z Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix Kan, E.W.H. Choi, W.K. Leoy, C.C. Chim, W.K. Antoniadis, D.A. Fitzgerald, E.A. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1608480 Applied Physics Letters 83 10 2058-2060 APPLA 2014-06-17T02:46:34Z 2014-06-17T02:46:34Z 2003-09-08 Article Kan, E.W.H., Choi, W.K., Leoy, C.C., Chim, W.K., Antoniadis, D.A., Fitzgerald, E.A. (2003-09-08). Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix. Applied Physics Letters 83 (10) : 2058-2060. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1608480 00036951 http://scholarbank.nus.edu.sg/handle/10635/55741 000185089800051 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1608480
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Kan, E.W.H. Choi, W.K. Leoy, C.C. Chim, W.K. Antoniadis, D.A. Fitzgerald, E.A.
format	Article
author	Kan, E.W.H. Choi, W.K. Leoy, C.C. Chim, W.K. Antoniadis, D.A. Fitzgerald, E.A.
spellingShingle	Kan, E.W.H. Choi, W.K. Leoy, C.C. Chim, W.K. Antoniadis, D.A. Fitzgerald, E.A. Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
author_sort	Kan, E.W.H.
title	Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
title_short	Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
title_full	Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
title_fullStr	Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
title_full_unstemmed	Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
title_sort	effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55741
_version_	1781412182219554816

Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrix

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