Effects of volatility of etch by-products on surface roughness during etching of metal gates in Cl2

10.1149/1.2799079

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書目詳細資料
Main Authors: Hwang, W.S., Cho, B.-J., Chan, D.S.H., Lee, S.W., Yoo, W.J.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/55785
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