Electrical evaluation of laser annealed junctions by Hall measurements

Electrical evaluation of laser annealed junctions by Hall measurements

10.1016/j.tsf.2004.05.024

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Bibliographic Details
Main Authors: Poon, C.H., Tan, L.S., Cho, B.J., Ng, K.T., Bhat, M., Chan, L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Hall measurements
Laser annealing
Silicon
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55818
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/55818

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