Electrical evaluation of laser annealed junctions by Hall measurements
10.1016/j.tsf.2004.05.024
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sg-nus-scholar.10635-558182024-11-14T01:24:58Z Electrical evaluation of laser annealed junctions by Hall measurements Poon, C.H. Tan, L.S. Cho, B.J. Ng, K.T. Bhat, M. Chan, L. ELECTRICAL & COMPUTER ENGINEERING Hall measurements Laser annealing Silicon 10.1016/j.tsf.2004.05.024 Thin Solid Films 462-463 SPEC. ISS. 72-75 THSFA 2014-06-17T02:47:28Z 2014-06-17T02:47:28Z 2004-09 Article Poon, C.H., Tan, L.S., Cho, B.J., Ng, K.T., Bhat, M., Chan, L. (2004-09). Electrical evaluation of laser annealed junctions by Hall measurements. Thin Solid Films 462-463 (SPEC. ISS.) : 72-75. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2004.05.024 00406090 http://scholarbank.nus.edu.sg/handle/10635/55818 000223812800016 Scopus |
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Hall measurements Laser annealing Silicon |
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Hall measurements Laser annealing Silicon Poon, C.H. Tan, L.S. Cho, B.J. Ng, K.T. Bhat, M. Chan, L. Electrical evaluation of laser annealed junctions by Hall measurements |
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10.1016/j.tsf.2004.05.024 |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Poon, C.H. Tan, L.S. Cho, B.J. Ng, K.T. Bhat, M. Chan, L. |
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Article |
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Poon, C.H. Tan, L.S. Cho, B.J. Ng, K.T. Bhat, M. Chan, L. |
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Poon, C.H. |
title |
Electrical evaluation of laser annealed junctions by Hall measurements |
title_short |
Electrical evaluation of laser annealed junctions by Hall measurements |
title_full |
Electrical evaluation of laser annealed junctions by Hall measurements |
title_fullStr |
Electrical evaluation of laser annealed junctions by Hall measurements |
title_full_unstemmed |
Electrical evaluation of laser annealed junctions by Hall measurements |
title_sort |
electrical evaluation of laser annealed junctions by hall measurements |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55818 |
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