Elevated-confined phase-change random access memory cells

10.1143/JJAP.49.04DD16

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Bibliographic Details
Main Authors:	Koon, L.H., Luping, S., Rong, Z., Hongxin, Y., Guan, L.K., Jianming, L., Chong, C.T.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55859
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Institution:	National University of Singapore

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