Investigation of nano-phase change for phase change random access memory

Investigation of nano-phase change for phase change random access memory

7th Annual Non-Volatile Memory Technology Symposium, NVMTS

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Bibliographic Details
Main Authors: Shi, L.P., Chong, T.C., Wei, X.Q., Zhao, R., Wang, W.J., Yang, H.X., Lee, H.K., Li, J.M., Yeo, N.Y., Lim, K.G., Miao, X.S., Song, W.D.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Crystallization temperature
Nano-phase change
Non-volatile memory (NVM)
Phase change RAM (PCRAM)
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70682
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/70682

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